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1

Multiphysics modeling of pulsed laser welding

Bruyere, Vincent, Touvrey, Charline, Namy, Patrick, Authier, Nicolas

Journal:

Journal of Laser Applications

Year:

2017

Language:

english

File:

PDF, 1.25 MB

english, 2017

2

Penser les humanités médicales entre culture littéraire et culture de la vie

Bruyère, Vincent

Journal:

L'Esprit Créateur

Year:

2014

Language:

french

File:

PDF, 76 KB

french, 2014

3

Body effect induced wear-out acceleration in ultra-thin oxides

S. Bruyère, D. Roy, E. Robilliart, E. Vincent, G. Ghibaudo

Journal:

Microelectronics Reliability

Year:

2001

Language:

english

File:

PDF, 372 KB

english, 2001

4

Model for the oxide thickness dependence of SILC generation based on anode hole injection process

C. Jahan, S. Bruyère, G. Ghibaudo, E. Vincent, K. Barla

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 284 KB

english, 1999

5

Review on high-k dielectrics reliability issues

Ribes, G., Mitard, J., Denais, M., Bruyere, S., Monsieur, F., Parthasarathy, C., Vincent, E., Ghibaudo, G.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2005

Language:

english

File:

PDF, 854 KB

english, 2005

6

Vectorial tolerance allocation of bevel gear by discrete optimization

Jean-Yves Dantan, Jérome Bruyere, Jean-Paul Vincent, Regis Bigot

Journal:

Mechanism and Machine Theory

Year:

2008

Language:

english

File:

PDF, 322 KB

english, 2008

7

Failures in ultrathin oxides: Stored energy or carrier energy driven?

S. Bruyére, F. Monsieur, D. Roy, E. Vincent, G. Ghibaudo

Journal:

Microelectronics Reliability

Year:

2001

File:

PDF, 393 KB

2001

8

Determination of Dielectric Breakdown Weibull Distribution Parameters Confidence Bounds for Accurate Ultrathin Oxide Reliability Predictions

F. Monsieur, E. Vincent, D. Roy, S. Bruyere, G. Pananakakis, G. Ghibaudo

Journal:

Microelectronics Reliability

Year:

2001

File:

PDF, 376 KB

2001

9

Temperature acceleration of breakdown and quasi-breakdown phenomena in ultra-thin oxides

S. Bruyère, D. Roy, E. Vincent, G. Ghibaudo

Journal:

Microelectronics Reliability

Year:

1999

Language:

english

File:

PDF, 361 KB

english, 1999

10

Wet or dry ultrathin oxides: impact on gate oxide and device reliability

S Bruyère, F Guyader, W De Coster, E Vincent, M Saadeddine, N Revil, G Ghibaudo

Journal:

Microelectronics Reliability

Year:

2000

Language:

english

File:

PDF, 189 KB

english, 2000

11

Unified model for breakdown in thin and ultrathin gate oxides (12–5 nm)

Kamoulakos, George, Kelaidis, Christine, Papadas, Constantin, Vincent, Emmanuel, Bruyere, Sylvie, Ghibaudo, Gerard, Pananakakis, Georges, Mortini, Patrick, Ghidini, Gabriella

Journal:

Journal of Applied Physics

Year:

1999

Language:

english

File:

PDF, 423 KB

english, 1999

12

Paroles en l’air: Climate Change and the Science of Fables

Bruyère, Vincent

Journal:

Year:

2013

Language:

english

File:

PDF, 294 KB

english, 2013

13

MIM capacitance variation under electrical stress

C. Besset, S. Bruyère, S. Blonkowski, S. Crémer, E. Vincent

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 139 KB

english, 2003

14

Dielectric reliability in deep-submicron technologies: From thin to ultrathin oxides

E. Vincent, S. Bruyere, C. Papadas, P. Mortini

Journal:

Microelectronics Reliability

Year:

1997

Language:

english

File:

PDF, 587 KB

english, 1997

15

Emerging oxide degradation mechanisms: Stress induced leakage current (SILC) and quasi-breakdown (QB)

G. Ghibaudo, P. Riess, S. Bruyère, B. DeSalvo, C. Jahan, A. Scarpa, G. Pananakakis, E. Vincent

Journal:

Microelectronic Engineering

Year:

1999

Language:

english

File:

PDF, 751 KB

english, 1999

16

Gate oxide Reliability assessment optimization

F. Monsieur, E. Vincent, D. Roy, S. Bruyère, G. Pananakakis, G. Ghibaudo

Journal:

Microelectronics Reliability

Year:

2002

File:

PDF, 753 KB

2002

17

Series resistance and oxide thickness spread influence on Weibull breakdown distribution: New experimental correction for reliability projection improvement

D. Roy, S. Bruyere, E. Vincent, F. Monsieur

Journal:

Microelectronics Reliability

Year:

2002

File:

PDF, 1.82 MB

2002

18

On the role of holes in oxide breakdown mechanism in inverted nMOSFETs

F Monsieur, E Vincent, V Huard, S Bruyère, D Roy, T Skotnicki, G Pananakakis, G Ghibaudo

Journal:

Microelectronics Reliability

Year:

2003

Language:

english

File:

PDF, 133 KB

english, 2003

19

[IEEE 2001 IEEE International Integrated Reliability Workshop. Final Report - Lake Tahoe, CA, USA (15-18 Oct. 2001)] 2001 IEEE International Integrated Reliability Workshop. Final Report (Cat. No.01TH8580) - Accurate and efficient design of experiment for reliability assessment. Application to a 20 Å gate oxide

Monsieur, F., Vincent, E., Roy, D., Bruyere, S., Pasqualini, F., Pananakakis, G., Ghibaudo, G.

Year:

2001

Language:

english

File:

PDF, 617 KB

english, 2001

20

[IEEE 2015 6th International Conference on Information Systems and Economic Intelligence (SIIE) - Hammamet, Tunisia (2015.2.12-2015.2.14)] 2015 6th International Conference on Information Systems and Economic Intelligence (SIIE) - Creation of a data observatory enables the uncovering of consumer behavior by client behavioral study, through the use of 1st generation loyalty and stimulation platforms: Conception of an observatory of consumer data, the "Promo Place" project

Bruyere, Sebastien, Oechsel, Vincent

Year:

2015

Language:

english

File:

PDF, 519 KB

english, 2015

21

Stroke and the Remembered Body: You See Me Directed by Linda S. Brown, 2015

Bruyere, Vincent

Journal:

Journal of Medical Humanities

Year:

2018

Language:

english

File:

PDF, 328 KB

english, 2018

22

Comprehensive characterization of the mutational landscape in multiple myeloma cell lines reveals potential drivers and pathways associated with tumor progression and drug resistance

Vikova, Veronika, Jourdan, Michel, Robert, Nicolas, Requirand, Guilhem, Boireau, Stéphanie, Bruyer, Angélique, Vincent, Laure, Cartron, Guillaume, Klein, Bernard, Elemento, Olivier, Kassambara, Albouk

Journal:

Year:

2019

Language:

english

File:

PDF, 2.76 MB

english, 2019

23

Gate dielectrics for ultimate CMOS technologies – Limitations and alternative solutions

G. Ghibaudo, R. Clerc, E. Vincent, S. Bruyère, J.L. Autran

Journal:

Comptes Rendus de l'Académie des Sciences - Series IV - Physics-Astrophysics

Year:

2000

Language:

french

File:

PDF, 557 KB

french, 2000

24

Evidence of nutriceutical effectiveness in the treatment of osteoarthritis

J. Y. Reginster, Vincent Gillot, Olivier Bruyere, Yves Henrotin

Journal:

Current Rheumatology Reports

Year:

2000

Language:

english

File:

PDF, 243 KB

english, 2000

25

Motor memory and the preselection effect in Huntington's and Parkinson's disease

Florence Pasquier, Martial Van der Linden, Vincent Lefebvre, Christine Lefebvre, Raymond Bruyer, Henri Petit

Journal:

Neuropsychologia

Year:

1994

Language:

english

File:

PDF, 1.31 MB

english, 1994

26

Membrane-type 4 matrix metalloproteinase (MT4-MMP) induces lung metastasis by alteration of primary breast tumour vascular architecture

Vincent Chabottaux, Stéphanie Ricaud, Laurent Host, Silvia Blacher, Alexandra Paye, Marc Thiry, Anikitos Garofalakis, Carine Pestourie, Karine Gombert, Françoise Bruyere, Daniel Lewandowsky, Bertrand

Journal:

Journal of Cellular and Molecular Medicine

Year:

2009

Language:

english

File:

PDF, 1.21 MB

english, 2009

27

Improved method for the oxide thickness extraction in MOS structures with ultrathin gate dielectrics

Ghibaudo, G., Bruyere, S., Devoivre, T., DeSalvo, B., Vincent, E.

Journal:

IEEE Transactions on Semiconductor Manufacturing

Year:

2000

Language:

english

File:

PDF, 187 KB

english, 2000

28

[IEEE 2000 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (23-26 Oct. 2000)] 2000 IEEE International Integrated Reliability Workshop Final Report (Cat. No.00TH8515) - Quasi-breakdown in ultra-thin oxides: some insights on the physical mechanisms

Bruyere, S., Roy, D., Vincent, E., Ghibaudo, G.

Year:

2000

Language:

english

File:

PDF, 521 KB

english, 2000

29

[IEEE 1998 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (12-15 Oct. 1998)] 1998 IEEE International Integrated Reliability Workshop Final Report (Cat. No.98TH8363) - Electric field and temperature acceleration of quasi-breakdown phenomena in ultrathin oxides

Roy, D., Bruyere, S., Vincent, E., Ghibaudo, G.

Year:

1998

Language:

english

File:

PDF, 618 KB

english, 1998

30

[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - A thorough investigation of progressive breakdown in ultra-thin oxides. Physical understanding and application for industrial reliability assessment

Monsieur, F., Vincent, E., Roy, D., Bruyere, S., Vildeuil, J.C., Pananakakis, G., Ghibaudo, G.

Year:

2002

Language:

english

File:

PDF, 722 KB

english, 2002

31

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - Stability of capacitance voltage linearity for high-k MIM capacitor

Besset, C., Bruyere, S., Monsieur, R., Boret, S., Deloffre, E., Vincent, E.

Year:

2005

Language:

english

File:

PDF, 403 KB

english, 2005

32

[IEEE 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - San Jose, CA, USA (April 17-21, 2005)] 2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual. - High-K dielectrics breakdown accurate lifetme assessment methodology

Ribes, Q., Bruyere, S., Denais, M., Monsieur, F., Roy, D., Vincent, E., Ghibaudo,

Year:

2005

Language:

english

File:

PDF, 1.02 MB

english, 2005

33

[IEEE 1999 IEEE International Integrated Reliability Workshop Final Report - Lake Tahoe, CA, USA (18-21 Oct. 1999)] 1999 IEEE International Integrated Reliability Workshop Final Report (Cat. No. 99TH8460) - Limiting oxide failure mode versus oxide thickness. Some insights for deep-submicron technologies

Bruyere, S., Vincent, E., Ghibaudo, G.

Year:

1999

Language:

english

File:

PDF, 478 KB

english, 1999

34

[IEEE International Reliability Physics Symposium - Dallas, TX, USA (30 March-4 April 2003)] 2003 IEEE International Reliability Physics Symposium Proceedings, 2003. 41st Annual. - Evidence for defect-generation-driven wear-out of breakdown conduction path in ultra thin oxides

Monsieur, F., Vincent, E., Ribes, G., Huard, V., Bruyere, S., Roy, D., Pananakakis, G., Ghibaudo, G.

Year:

2003

Language:

english

File:

PDF, 528 KB

english, 2003

35

[IEEE 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual - San Jose, CA, USA (10-13 April 2000)] 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) - Quasi-breakdown in ultra-thin SiO/sub 2/ films: occurrence characterization and reliability assessment methodology

Bruyere, S., Vincent, E., Ghibaudo, G.

Year:

2000

Language:

english

File:

PDF, 601 KB

english, 2000

36

[IEEE IEEE International Integrated Reliability Workshop - Lake Tahoe, CA, USA (21-24 Oct. 2002)] IEEE International Integrated Reliability Workshop Final Report, 2002. - Evidence for defect-generation-driven wear-out of breakdown conduction path in ultra thin oxides

Monsieur, F., Vincent, E., Ribes, G., Huard, V., Bruyere, S., Roy, D., Pananakakis, G., Ghibaudo, G.

Year:

2002

Language:

english

File:

PDF, 533 KB

english, 2002

37

Épidémiologie de la lithiase urinaire en Belgique sur base d’une classification morpho-constitutionnelle

Castiglione, Vincent, Jouret, François, Bruyère, Olivier, Dubois, Bernard, Thomas, Alexandre, Waltregny, David, Bekaert, Anne-Catherine, Cavalier, Étienne, Gadisseur, Romy

Journal:

Néphrologie & Thérapeutique

Year:

2015

File:

PDF, 443 KB

2015

38

Early unclamping technique during robot-assisted laparoscopic partial nephrectomy can minimise warm ischaemia without increasing morbidity

Peyronnet, Benoit, Baumert, Hervé, Mathieu, Romain, Masson-Lecomte, Alexandra, Grassano, Yohann, Roumiguié, Mathieu, Massoud, Walid, Abd El Fattah, Vincent, Bruyère, Franck, Droupy, Stéphane, de la Ta

Journal:

BJU International

Year:

2014

Language:

english

File:

PDF, 178 KB

english, 2014

39

[IEEE International Conference on Microelectronic Test Structures - Goteborg, Sweden (15-18 March 1999)] ICMTS 1999. Proceedings of 1999 International Conference on Microelectronic Test Structures (Cat. No.99CH36307) - Improved method for the oxide thickness extraction in MOS structures with ultra-thin gate dielectrics

Ghibaudo, G., Bruyere, S., Devoivre, T., DeSalvo, B., Vincent, E.

Year:

1999

Language:

english

File:

PDF, 369 KB

english, 1999

40

Trends in the Use of the GreenLight Laser in the Surgical Management of Benign Prostatic Obstruction in France Over the Past 10 Years

Peyronnet, Benoit, Cornu, Jean-Nicolas, Rouprêt, Morgan, Bruyere, Franck, Misrai, Vincent

Journal:

European Urology

Year:

2015

Language:

english

File:

PDF, 576 KB

english, 2015

41

Can CT Pulmonary Angiography Allow Assessment of Severity and Prognosis in Patients Presenting with Pulmonary Embolism? What the Radiologist Needs to Know1

Ghaye, Benoît, Ghuysen, Alexandre, Bruyere, Pierre-Julien, D’Orio, Vincent, Dondelinger, Robert F.

Journal:

Year:

2006

Language:

english

File:

PDF, 1.25 MB

english, 2006

42

MP42-13 MULTI-CENTER INTERNATIONAL EXPERIENCE OF 180W LBO LASER PHOTO-VAPORIZATION IN MEN WITH LARGE PROSTATES (TRUS>100CC): SAFETY OUTCOMES AND PREDICTIVE FACTORS OF COMPLICATIONS

Meskawi, Malek, Hueber, Pierre-Alain, Valdivieso, Roger, Martel, Tristan, Azizi, Mounsif, Bruyère, Franck, Misrai, Vincent, Fournier, Georges, Munver, Ravi, Sivarajan, Ganesh, Rutman, Matthew, Te, Ale

Journal:

The Journal of Urology

Year:

2016

Language:

english

File:

PDF, 544 KB

english, 2016

43

PD24-11 MULTICENTER INTERNATIONAL EXPERIENCE OF 180W LBO LASER PHOTO-VAPORIZATION IN MEN WITH LARGE PROSTATES (PROSTATE VOLUME>100CC): LONG-TERM OUTCOMES OF 434 PATIENTS

Hueber, Pierre-Alain, Meskawi, Malek, Valdivieso, Roger, Martel, Tristan, Azizi, Mounsif, Bruyère, Franck, Misrai, Vincent, Fournier, Georges, Munver, Ravi, Sivarajan, Ganesh, Rutman, Matthew, Te, Ale

Journal:

The Journal of Urology

Year:

2016

Language:

english

File:

PDF, 689 KB

english, 2016

44

Behavior of short silica monolithic columns in high pressure gas chromatography

Maniquet, Adrien, Bruyer, Nicolas, Raffin, Guy, Baco-Antoniali, Franck, Demesmay, Claire, Dugas, Vincent, Randon, Jérôme

Journal:

Journal of Chromatography A

Year:

2016

Language:

english

File:

PDF, 952 KB

english, 2016

45

Adelaide Russo et Simon Harel (dirs), Lieux propices. L’énonciation des lieux / le lieu de l’énonciation, dans les contextes francophones interculturels, Québec, CELAT et Les Presses de l’Université Laval, 2005, 355 p.

Bruyère, Vincent

Journal:

Recherches sociographiques

Year:

2006

Language:

french

File:

PDF, 147 KB

french, 2006

46

L’archéologue autopsié : la traversée de l’anatomo-clinique dans L’Écart de V. Y. Mudimbe

Bruyère, Vincent

Journal:

Revue de l'Université de Moncton

Year:

2006

Language:

french

File:

PDF, 140 KB

french, 2006

47

Le martyre de sainte Sébastienne

Bruyère, Vincent

Journal:

Intermédialités: Histoire et théorie des arts, des lettres et des techniques

Year:

2011

Language:

french

File:

PDF, 564 KB

french, 2011

48

RECQ1 helicase is involved in replication stress survival and drug resistance in multiple myeloma

Viziteu, E, Klein, B, Basbous, J, Lin, Y-L, Hirtz, C, Gourzones, C, Tiers, L, Bruyer, A, Vincent, L, Grandmougin, C, Seckinger, A, Goldschmidt, H, Constantinou, A, Pasero, P, Hose, D, Moreaux, J

Journal:

Year:

2017

Language:

english

File:

PDF, 14.04 MB

english, 2017

49

Multicenter international experience of 532 nm-laser photo-vaporization with Greenlight XPS in men with large prostates (prostate volume > 100 cc)

Meskawi, Malek, Hueber, Pierre-Alain, Valdivieso, Roger, Bruyere, Franck, Misrai, Vincent, Fournier, Georges, Munver, Ravi, Sivarajan, Ganesh, Rutman, Matthew, Te, Alexis E., Chughtai, Bilal, Elterman

Journal:

World Journal of Urology

Year:

2017

Language:

english

File:

PDF, 704 KB

english, 2017

50

Behavior of macroporous vinyl silica and silica monolithic columns in high pressure gas chromatography

Maniquet, Adrien, Bruyer, Nicolas, Raffin, Guy, Baco-Antionali, Franck, Demesmay, Claire, Dugas, Vincent, Randon, Jérôme

Journal:

Journal of Chromatography A

Year:

2017

Language:

english

File:

PDF, 841 KB

english, 2017

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